[sdiy] Temperature compensation results
ASSI
Stromeko at compuserve.de
Mon Jun 16 21:48:20 CEST 2003
Hi all,
I hope I can give some answers...
On the standard Gummel-Poon model (SGPM) parameters ins Spice: EG is
the bandgap voltage extrapolated back to absolute zero (a linear
approximation is used here, while in other parts of Spice more
sophisticated modeling is used depending on Level) and should fall into
the range of 1.12...1.18V depending on general doping levels. XTI is
called the temperature exponent and should fall within 3...4 depending
again on technology. Among other things, the relative importance of
various recombination mechanisms plays a role.
The shortcomings of the SGPM have been recognized years ago, however
none of the three models that have been developed to overcome these
(VBIC, MEXTRAM, HICUM) has met general approval. MEXTRAM and HICUM have
been recommended for evaluation around the 2001 timeframe and AFAIK not
much has happened since. All three models continue to coexist and most
commercial simulators support all of them.
Statistical (mis)match for bipolar IC is, just as in CMOS, mainly a
linear function of 1/sqrt(area). The proportionality factor is a
technology constant, which is quite hard to improve. When the
dimensions of the structure approach the technology capability limit,
the mismatch leaves the proportional curve, which is why no competent
analog designer will use minimum structures when trying to match
something. Systematic mismatch, for instance due to gradients of any
sort (doping levels, temperature, mechanical stress) can also be
minimized by good layout practices like common centroid layout. A
specific rule for bipolar transistors is that the emitter area to
circumference ratio should be be maximized (which would lead to
circular emitters, but depending on the mask-making technology that may
not be feasible).
The physical origin of statistical mismatch is attributed to the
discrete nature of dopants and imperfections in their distribution.
Call them micro-defects if you will. Extended defects are generally not
factored into the matching equation AFAIK. BTW, last I looked there
also was no commonly accepted explanation for shot noise.
For matching discrete transistors, it is a good idea to make sure
they're from the same batch and not just the same type if you care
about more than Vbe matching at a single point. Using lots of them in
parallel also improves matching as long as you can keep temperature
gradients in check. Come to think of it, I have a large number of
unmarked SOT transistors, maybe I should make a PCB for those...
Another idea is to use emitter degeneration and to make sure that the
resistors are matched. There are a number of precision matched resistor
arrays that could be used for that, e.g. from Vishay. They're not
cheap, but they come in single packages with up to eight resistors and
you can't get quad or octet transistor as easily. Temperature tracking
within a package is better than 5ppm, matching 50ppm and TC 10ppm for
the NiCr variant and 10ppm/?/100ppm for TaN films at about a third the
price.
Achim.
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