Dominic has mentioned this and trying to set the core to break from reset will not work with some ARM7 cores, the two i know of are the LPC and the STR7. The jtag cell and ice logic are both reset when the reset (nSRT) are asserted, this is done internally without touching TSRT. Your method is used (see below) but will not work in the case of the LPC/STR7 - it has been tried. The behaviour you mention is used on some arm cores (mainly ARM9) to set a breakpoint at address 0 and perform a hard reset. Regards Spen --- In lpc2000@yahoogroups.com, Jayasooriah <jayasooriah@...> wrote: > > Dominic, > > My apologies. I misread nSRTS as nTRST, and I incorrectly referred to > EmbeddedICE-RT macrocell as ETM -- I did not meant to discuss ETM at all. > > I have no experience with EIRM debugging myself and what I am raising here > is mainly based on scanning ARM7-DTMI-S Technical Reference Manual (TRM) > (Revision 4) for the purposes of this discussion :) > > At 03:19 09/02/2006, lpc2000@yahoogroups.com wrote: > > Date: Wed, 8 Feb 2006 16:58:45 +0100 > > From: Dominic Rath <Dominic.Rath@> > >Subject: Re: re: CRP exploits using JTAG > >... > > > To use the boundary scan interface, nTRST must be driven LOW and then HIGH > > > again. You appear to have held it low, and hence your observations. > >No. This behaviour has been confirmed by someone from Rowley. > > I was quoting the above from 5.12.1 of the TRM. Note that it also says in > this section that when the boundary scan interface is not used, you can tie > DBGnTRST input low. Is this what your OpenCD tool does? > > >... > >On the LPCs, driving nRESET low keeps the TAP controller in reset, too. > >Period. > > I heard you the first time, but where would one find this information? If > it was established by experimentation, how was nTRST driven? LOW then > HIGH or just LOW? > > >Just because you believe that this is the reason why Philips dumped the > >exception vectors doesnt necessarily mean that there's a way to cut the > >number of TCK cycles down. > > IMHO we (you and I) cannot conclusively say one way or another. Only the > designers can, and they have chosen not to. > > What they have said, however, is: > > "EmbeddedICE logic ... allows instructions to execute at a slow debug speed > or at fast system speed" > > "The scan chains that are around the core for production test are reused in > the debug state ..." > > If I had my JTAG to play with (and the time to play), I would try the > following while nRESET is held low: > > a) select SCAN_N instruction > b) select chain #1 (later 5,6,7,9-15 and so on) > c) select INTEST instruction > d) scan DBGBREAK bit (for chain #1) > > and then see how long it then takes to enter debug mode in halt state upon > releasing nRESET. > > Jaya > > PS: > > > Send instant messages to your online friends http://au.messenger.yahoo.com >
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Re: CRP exploits using JTAG
2006-02-09 by ntfreak2000
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