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Message

Re: LPC FLASH security (CRP) broken?

2005-12-22 by derbaier

--- In lpc2000@yahoogroups.com, Mauricio Scaff <scaffm@g...> wrote:
> 
> 
> > I can assure you we have an options to program the virgin device on
> > a tester.
> >
> Let's say that your answer is a little bit obscure. So my code is 
> protected as far as no one knows what happens in that "tester" ? It 
> doesn't look like something very safe.
> 

How can you catagorize it as not "very safe" without even knowing what
a "tester" is??  A tester, like the HP3000, is often used to test
devices while they are still on the wafer prior to packaging.  Devices
at that stage are far more accesible than they are after they are
packaged, and all you can get at are the pins or balls. It could also
program the device via access methods that become completely
unavailable after packaging. For instance, if the device is a "stacked
die" part, then it could be programed before the dice are even bonded
out. This is not to say that is what is actually happening, but just
to point out that making a judgement from a position of no knowledge
is not likely to be very profitable to anyone.

BTW, if you are assuming that what is happening is just hidden access
mechanisms on completed parts, then I would agree that you are
justified in worrying about security. "Security by obscurity" always
fails eventually.

-- Dave

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